LUIS MIGUEL
SÁNCHEZ BREA
Profesor titular de universidad
Philip
Siegmann
Publications dans lesquelles il/elle collabore avec Philip Siegmann (10)
2008
2004
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Comparison between optical techniques and confocal microscopy for defect detection on thin wires
Applied Surface Science
2002
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Diffraction in wide slits with semi-cylindrical edges
Optik (Jena), Vol. 113, Núm. 2, pp. 57-62
2001
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Classification of surface structures on fine metallic wires
Applied Surface Science, Vol. 180, Núm. 3-4, pp. 191-199
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In-line detection and evaluation of surface defects on thin metallic wires
Proceedings of SPIE - The International Society for Optical Engineering
2000
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Detection of surface defects on thin metallic wires by geometric conical diffraction
Wire Journal International, Vol. 33, Núm. 8, pp. 124-127
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Optical technique for the automatic detection and measurement of surface defects on thin metallic wires
Applied Optics, Vol. 39, Núm. 4, pp. 539-545
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Sensores ópticos para el desarrollo y control industrial
VI Reunión Nacional de Óptica
1999
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Detection of surface defects on thin metallic wires by geometrical conical diffraction
Proceedings of the Annual Convention of the Wire Association International, pp. 527-530
1998
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Detection of surface defects on thin metallic wires by geometrical conical diffraction
WIRE & CABLE TECHNICAL SYMPOSIUM (WCTS), CONFERENCE PROCEEDINGS