Publicacions en col·laboració amb investigadors/es de Daresbury Laboratory (6)

2017

  1. Carrier Localization in GaN/AlN Quantum Dots As Revealed by Three-Dimensional Multimicroscopy

    Nano Letters, Vol. 17, Núm. 7, pp. 4261-4269

  2. Reverse Monte Carlo reconstruction algorithm for discrete electron tomography based on HAADF-STEM atom counting

    Journal of Microscopy, Vol. 265, Núm. 1, pp. 73-80

2016

  1. HAADF-STEM analysis of the composition distribution in InAlAsSb/InGaAs/InP layers for solar cells applications

    Microscopy and Microanalysis

  2. Multi-microscopy study of the influence of stacking faults and three-dimensional In distribution on the optical properties of m-plane InGaN quantum wells grown on microwire sidewalls

    Applied Physics Letters, Vol. 108, Núm. 4

  3. Statistical correction of atom probe tomography data of semiconductor alloys combined with optical spectroscopy: The case of Al0.25Ga0.75N

    Journal of Applied Physics, Vol. 119, Núm. 10

  4. Statistical nanoscale study of localised radiative transitions in GaN/AlGaN quantum wells and AlGaN epitaxial layers

    Semiconductor Science and Technology, Vol. 31, Núm. 9