FRANCISCO JAVIER
PIQUERAS DE NORIEGA
Investigador en el periodo 2007-2017
University of Bologna
Bolonia, ItaliaPublicaciones en colaboración con investigadores/as de University of Bologna (15)
2014
-
Hierarchical ZnGa
2
O
4
and Cr doped Zn
1-x
MnxGa
2
O
4
nanostructures for room temperature light-emitting devices
Materials Research Express, Vol. 1, Núm. 2
-
β-Ga2O3nanowires for an ultraviolet light selective frequency photodetector
Journal of Physics D: Applied Physics, Vol. 47, Núm. 41
2003
-
Defect assessment of Mg-doped GaN by beam injection techniques
Journal of Applied Physics, Vol. 94, Núm. 12, pp. 7470-7475
-
Time-resolved cathodoluminescence and photocurrent study of the yellow band in Si-doped GaN
Journal of Applied Physics, Vol. 94, Núm. 4, pp. 2341-2346
-
Time-resolved cathodoluminescence assessment of deep-level transitions in hydride-vapor-phase-epitaxy GaN
Applied Physics Letters, Vol. 82, Núm. 13, pp. 2050-2052
2002
-
Characterization of thin layers of n- and p-type GaN
Materials Science and Engineering B: Solid-State Materials for Advanced Technology
-
Electrical and optical characterization of GaN HVPE layers related to extended defects
Journal of Physics Condensed Matter, Vol. 14, Núm. 48, pp. 13095-13104
1998
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Analyses of compensation related defects in II-VI compounds
Materials Research Society Symposium - Proceedings
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Deep energy levels in CdTe and CdZnTe
Journal of Applied Physics, Vol. 83, Núm. 4, pp. 2121-2126
1997
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Investigation of deep energy levels in II-VI compounds
Materials Research Society Symposium - Proceedings
1996
-
Comparison of electrical and luminescence data for the A center in CdTe
Applied Physics Letters, Vol. 69, Núm. 23, pp. 3510-3512
-
Compensation and deep levels in II-VI compounds
Materials Science and Engineering B, Vol. 42, Núm. 1-3, pp. 302-305
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Electrical and optical properties of defects by complementary spectroscopies
Materials Research Society Symposium - Proceedings
1995
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The EL2 trap in highly doped GaAs:Te
Journal of Applied Physics, Vol. 78, Núm. 11, pp. 6592-6595
1994
-
Spatial distribution of recombination centers in GaAs:Te: Effects of the doping level
Journal of Applied Physics, Vol. 76, Núm. 2, pp. 987-992