Study of growth hillocks in GaN:Si films by electron beam induced current imaging

  1. Herrera Zaldivar, M.
  2. Fernández, P.
  3. Piqueras, J.
Journal:
Journal of Applied Physics

ISSN: 0021-8979

Year of publication: 2001

Volume: 90

Issue: 2

Pages: 1058-1060

Type: Article

DOI: 10.1063/1.1379773 GOOGLE SCHOLAR
Data source: Scopus