Study of growth hillocks in GaN:Si films by electron beam induced current imaging
- Herrera Zaldivar, M.
- Fernández, P.
- Piqueras, J.
ISSN: 0021-8979
Année de publication: 2001
Volumen: 90
Número: 2
Pages: 1058-1060
Type: Article
Revue:
Journal of Applied Physics