Thermally induced modifications on bonding configuration and density of defects of plasma deposited SiO x:H films

  1. San Andrés, E.
  2. Del Prado, A.
  3. Mártil, I.
  4. González-Díaz, G.
  5. Bravo, D.
  6. López, F.J.
Revue:
Journal of Applied Physics

ISSN: 0021-8979

Année de publication: 2002

Volumen: 92

Número: 4

Pages: 1906-1913

Type: Article

DOI: 10.1063/1.1495068 GOOGLE SCHOLAR