Epitaxial integration of CoFe 2 O 4 thin films on Si (001) surfaces using TiN buffer layers

  1. Prieto, P.
  2. Marco, J.F.
  3. Prieto, J.E.
  4. Ruiz-Gomez, S.
  5. Perez, L.
  6. del Real, R.P.
  7. Vázquez, M.
  8. de la Figuera, J.
Journal:
Applied Surface Science

ISSN: 0169-4332

Year of publication: 2018

Volume: 436

Pages: 1067-1074

Type: Article

DOI: 10.1016/J.APSUSC.2017.12.111 GOOGLE SCHOLAR