Epitaxial integration of CoFe 2 O 4 thin films on Si (001) surfaces using TiN buffer layers
- Prieto, P.
- Marco, J.F.
- Prieto, J.E.
- Ruiz-Gomez, S.
- Perez, L.
- del Real, R.P.
- Vázquez, M.
- de la Figuera, J.
Revue:
Applied Surface Science
ISSN: 0169-4332
Année de publication: 2018
Volumen: 436
Pages: 1067-1074
Type: Article