Accuracy of the thin metallic wires diameter using Fraunhofer diffraction technique

  1. Serroukh, I.
  2. Martínez-Antón, J.C.
  3. Bernabeu, E.
Journal:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

Year of publication: 2000

Volume: 4099

Issue: 1

Pages: 255-266

Type: Article

DOI: 10.1117/12.405827 GOOGLE SCHOLAR
Data source: Scopus