Accuracy of the thin metallic wires diameter using Fraunhofer diffraction technique

  1. Serroukh, I.
  2. Martínez-Antón, J.C.
  3. Bernabeu, E.
Aldizkaria:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

Argitalpen urtea: 2000

Alea: 4099

Zenbakia: 1

Orrialdeak: 255-266

Mota: Artikulua

DOI: 10.1117/12.405827 GOOGLE SCHOLAR
Datuen iturria: Scopus