Robust Inference for One-Shot Device Testing Data under Weibull Lifetime Model

  1. Balakrishnan, N.
  2. Castilla, E.
  3. Martin, N.
  4. Pardo, L.
Revue:
IEEE Transactions on Reliability

ISSN: 1558-1721,  0018-9529

Année de publication: 2020

Volumen: 69

Número: 3

Pages: 937-953

Type: Article

DOI: 10.1109/TR.2019.2954385 GOOGLE SCHOLAR
La source de données: Scopus