Robust Estimators and Test Statistics for One-Shot Device Testing under the Exponential Distribution

  1. Balakrishnan, N.
  2. Castilla, E.
  3. Martin, N.
  4. Pardo, L.
Journal:
IEEE Transactions on Information Theory

ISSN: 1557-9654,  0018-9448

Year of publication: 2019

Volume: 65

Issue: 5

Pages: 3080-3096

Type: Article

DOI: 10.1109/TIT.2019.2903244 GOOGLE SCHOLAR
Data source: Scopus