Robust Estimators and Test Statistics for One-Shot Device Testing under the Exponential Distribution
- Balakrishnan, N.
- Castilla, E.
- Martin, N.
- Pardo, L.
ISSN: 1557-9654, 0018-9448
Année de publication: 2019
Volumen: 65
Número: 5
Pages: 3080-3096
Type: Article