Calibration of coercive and stray fields of commercial magnetic force microscope probes
- Jaafar, M.
- Asenjo, A.
- Vázquez, M.
ISSN: 1536-125X
Année de publication: 2008
Volumen: 7
Número: 3
Pages: 245-250
Type: Article
Revue:
IEEE Transactions on Nanotechnology