A methodology to analyze the fault tolerance of demosaicking methods against memory single event functional interrupts (Sefis)

  1. Aranda, L.A.
  2. Sánchez-Macián, A.
  3. Maestro, J.A.
Journal:
Electronics (Switzerland)

ISSN: 2079-9292

Year of publication: 2020

Volume: 9

Issue: 10

Pages: 1-12

Type: Article

DOI: 10.3390/ELECTRONICS9101619 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus