A methodology to analyze the fault tolerance of demosaicking methods against memory single event functional interrupts (Sefis)

  1. Aranda, L.A.
  2. Sánchez-Macián, A.
  3. Maestro, J.A.
Aldizkaria:
Electronics (Switzerland)

ISSN: 2079-9292

Argitalpen urtea: 2020

Alea: 9

Zenbakia: 10

Orrialdeak: 1-12

Mota: Artikulua

DOI: 10.3390/ELECTRONICS9101619 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus