A methodology to analyze the fault tolerance of demosaicking methods against memory single event functional interrupts (Sefis)

  1. Aranda, L.A.
  2. Sánchez-Macián, A.
  3. Maestro, J.A.
Revue:
Electronics (Switzerland)

ISSN: 2079-9292

Année de publication: 2020

Volumen: 9

Número: 10

Pages: 1-12

Type: Article

DOI: 10.3390/ELECTRONICS9101619 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus