Diverse double modular redundancy: A new direction for soft-error detection and correction

  1. Reviriego, P.
  2. Maestro, J.A.
  3. Bleakley, C.J.
Journal:
IEEE Design and Test

ISSN: 2168-2356

Year of publication: 2013

Volume: 30

Issue: 2

Pages: 87-95

Type: Article

DOI: 10.1109/MDT.2012.2232964 GOOGLE SCHOLAR
Data source: Scopus