Validation and optimization of TMR protections for circuits in radiation environments

  1. Ruano, O.
  2. Maestro, J.A.
  3. Reviriego, P.
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2011

ISBN: 9781424497560

Year of publication: 2011

Pages: 399-400

Type: Conference paper

DOI: 10.1109/DDECS.2011.5783120 GOOGLE SCHOLAR