Improving memory reliability against soft errors using block parity

  1. Reviriego, P.
  2. Argyrides, C.
  3. Maestro, J.A.
  4. Pradhan, D.K.
Revue:
IEEE Transactions on Nuclear Science

ISSN: 0018-9499

Année de publication: 2011

Volumen: 58

Número: 3 PART 2

Pages: 981-986

Type: Communication dans un congrès

DOI: 10.1109/TNS.2011.2109965 GOOGLE SCHOLAR
La source de données: Scopus