A method to eliminate the event accumulation problem from a memory affected by multiple bit upsets

  1. Antonio Maestro, J.
  2. Reviriego, P.
Journal:
Microelectronics Reliability

ISSN: 0026-2714

Year of publication: 2009

Volume: 49

Issue: 7

Pages: 707-715

Type: Article

DOI: 10.1016/J.MICROREL.2009.05.002 GOOGLE SCHOLAR
Data source: Scopus