A method to eliminate the event accumulation problem from a memory affected by multiple bit upsets

  1. Antonio Maestro, J.
  2. Reviriego, P.
Revue:
Microelectronics Reliability

ISSN: 0026-2714

Année de publication: 2009

Volumen: 49

Número: 7

Pages: 707-715

Type: Article

DOI: 10.1016/J.MICROREL.2009.05.002 GOOGLE SCHOLAR
La source de données: Scopus