A method to eliminate the event accumulation problem from a memory affected by multiple bit upsets

  1. Antonio Maestro, J.
  2. Reviriego, P.
Aldizkaria:
Microelectronics Reliability

ISSN: 0026-2714

Argitalpen urtea: 2009

Alea: 49

Zenbakia: 7

Orrialdeak: 707-715

Mota: Artikulua

DOI: 10.1016/J.MICROREL.2009.05.002 GOOGLE SCHOLAR
Datuen iturria: Scopus