Reliability analysis of memories suffering multiple bit upsets

  1. Reviriego, P.
  2. Maestro, J.A.
  3. Cervantes, C.
Journal:
IEEE Transactions on Device and Materials Reliability

ISSN: 1530-4388,  1530-4388

Year of publication: 2007

Volume: 7

Issue: 4

Pages: 592-601

Type: Article

DOI: 10.1109/TDMR.2007.910443 GOOGLE SCHOLAR
Data source: Scopus