Reliability analysis of memories suffering multiple bit upsets

  1. Reviriego, P.
  2. Maestro, J.A.
  3. Cervantes, C.
Revue:
IEEE Transactions on Device and Materials Reliability

ISSN: 1530-4388,  1530-4388

Année de publication: 2007

Volumen: 7

Número: 4

Pages: 592-601

Type: Article

DOI: 10.1109/TDMR.2007.910443 GOOGLE SCHOLAR
La source de données: Scopus