Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories

  1. Korkian, G.
  2. Leon, D.
  3. Franco, F.J.
  4. Fabero, J.C.
  5. Letiche, M.
  6. Morilla, Y.
  7. Martin-Holgado, P.
  8. Puchner, H.
  9. Mecha, H.
  10. Clemente, J.A.
Journal:
IEEE Access

ISSN: 2169-3536

Year of publication: 2022

Volume: 10

Pages: 114566-114585

Type: Article

DOI: 10.1109/ACCESS.2022.3217527 GOOGLE SCHOLAR lock_openOpen access editor

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