Single Event Upsets Under Proton, Thermal, and Fast Neutron Irradiation in Emerging Nonvolatile Memories
- Korkian, G.
- Leon, D.
- Franco, F.J.
- Fabero, J.C.
- Letiche, M.
- Morilla, Y.
- Martin-Holgado, P.
- Puchner, H.
- Mecha, H.
- Clemente, J.A.
Revue:
IEEE Access
ISSN: 2169-3536
Année de publication: 2022
Volumen: 10
Pages: 114566-114585
Type: Article
