Impact of the Data Retention Threshold Voltage on the Cell-to-Cell SEU Sensitivity of COTS SRAMs

  1. Rezaei, M.
  2. Panduro, A.A.
  3. Franco, F.J.
  4. Fabero, J.C.
  5. Mecha, H.
  6. Letiche, M.
  7. Puchner, H.
  8. Clemente, J.A.
Konferenzberichte:
RADECS 2021 - European Conference on Radiation and its Effects on Components and Systems

ISBN: 9781665437943

Datum der Publikation: 2021

Art: Konferenz-Beitrag

DOI: 10.1109/RADECS53308.2021.9954475 GOOGLE SCHOLAR
Datenquelle: Scopus