Impact of the Data Retention Threshold Voltage on the Cell-to-Cell SEU Sensitivity of COTS SRAMs

  1. Rezaei, M.
  2. Panduro, A.A.
  3. Franco, F.J.
  4. Fabero, J.C.
  5. Mecha, H.
  6. Letiche, M.
  7. Puchner, H.
  8. Clemente, J.A.
Actas:
RADECS 2021 - European Conference on Radiation and its Effects on Components and Systems

ISBN: 9781665437943

Ano de publicación: 2021

Tipo: Achega congreso

DOI: 10.1109/RADECS53308.2021.9954475 GOOGLE SCHOLAR
Fonte de datos: Scopus