Impact of the Data Retention Threshold Voltage on the Cell-to-Cell SEU Sensitivity of COTS SRAMs

  1. Rezaei, M.
  2. Panduro, A.A.
  3. Franco, F.J.
  4. Fabero, J.C.
  5. Mecha, H.
  6. Letiche, M.
  7. Puchner, H.
  8. Clemente, J.A.
Proceedings:
RADECS 2021 - European Conference on Radiation and its Effects on Components and Systems

ISBN: 9781665437943

Year of publication: 2021

Type: Conference paper

DOI: 10.1109/RADECS53308.2021.9954475 GOOGLE SCHOLAR
Data source: Scopus