Impact of the Data Retention Threshold Voltage on the Cell-to-Cell SEU Sensitivity of COTS SRAMs

  1. Rezaei, M.
  2. Panduro, A.A.
  3. Franco, F.J.
  4. Fabero, J.C.
  5. Mecha, H.
  6. Letiche, M.
  7. Puchner, H.
  8. Clemente, J.A.
Actes de conférence:
RADECS 2021 - European Conference on Radiation and its Effects on Components and Systems

ISBN: 9781665437943

Année de publication: 2021

Type: Communication dans un congrès

DOI: 10.1109/RADECS53308.2021.9954475 GOOGLE SCHOLAR
La source de données: Scopus