A microspectroscopic study of cap damage in annealed RE-doped AlN-capped

  1. Nogales, E.
  2. Lorenz, K.
  3. Wang, K.
  4. Roqan, I. S.
  5. Martin, R. W.
  6. O'Donnell, K. P.
  7. Alves, E.
  8. Ruffenach, S.
  9. Briot, O.
Liburu bilduma:
GAN, AIN, INN AND RELATED MATERIALS
  1. Kuball, M (coord.)
  2. Myers, TH (coord.)
  3. Redwing, JM (coord.)
  4. Mukai, T (coord.)

ISSN: 0272-9172

ISBN: 1-55899-846-2

Argitalpen urtea: 2006

Alea: 892

Orrialdeak: 625-626

Biltzarra: Symposium on GaN, AIN, InN Related Materials held at the 2005 MRS Fall Meeting

Mota: Biltzar ekarpena

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Datuen iturria: WoS