A microspectroscopic study of cap damage in annealed RE-doped AlN-capped

  1. Nogales, E.
  2. Lorenz, K.
  3. Wang, K.
  4. Roqan, I. S.
  5. Martin, R. W.
  6. O'Donnell, K. P.
  7. Alves, E.
  8. Ruffenach, S.
  9. Briot, O.
Colección de libros:
GAN, AIN, INN AND RELATED MATERIALS
  1. Kuball, M (coord.)
  2. Myers, TH (coord.)
  3. Redwing, JM (coord.)
  4. Mukai, T (coord.)

ISSN: 0272-9172

ISBN: 1-55899-846-2

Ano de publicación: 2006

Volume: 892

Páxinas: 625-626

Congreso: Symposium on GaN, AIN, InN Related Materials held at the 2005 MRS Fall Meeting

Tipo: Achega congreso

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Fonte de datos: WoS