Center for Physical Sciences and Technology-ko ikertzaileekin lankidetzan egindako argitalpenak (5)

2002

  1. Influence of the calibration kit on the estimation of parasitic effects in HEMT devices at microwave frequencies

    IEEE Transactions on Instrumentation and Measurement, Vol. 51, Núm. 4, pp. 650-655

2001

  1. Characterization of parasitics in microwave devices by comparing S and noise parameter measurements with two different on wafer calibration techniques

    Conference Record - IEEE Instrumentation and Measurement Technology Conference, Vol. 1, pp. 530-533

2000

  1. Design, processing and characterization of delta-doped channel AlGaAs/InGaAs/GaAs HFETs

    Semiconductor Science and Technology, Vol. 15, Núm. 7, pp. 728-735

  2. Noise performance of a ground gate wideband MMIC amplifier

    2000 30th European Microwave Conference, EuMC 2000

1998

  1. Microwave noise measurements on Al0.3Ga0.7As/GaAs channels grown by molecular beam epitaxy using As2 and As4

    Semiconductor Science and Technology, Vol. 13, Núm. 7, pp. 833-836