Publicaciones en colaboración con investigadores/as de McMaster University (3)

2024

  1. Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution

    Journal of Computational and Applied Mathematics, Vol. 437

  2. Step-stress tests for interval-censored data under gamma lifetime distribution

    Quality Engineering, Vol. 36, Núm. 1, pp. 3-20

2023

  1. Robust inference for nondestructive one-shot device testing under step-stress model with exponential lifetimes

    Quality and Reliability Engineering International, Vol. 39, Núm. 4, pp. 1192-1222