Nanoscopic study of ZnO films by electron beam induced current in the scanning tunneling microscope

  1. Urbieta, A.
  2. Fernández, P.
  3. Piqueras, J.
  4. Vasco, E.
  5. Zaldo, C.
Journal:
Journal of Optoelectronics and Advanced Materials

ISSN: 1454-4164

Year of publication: 2004

Volume: 6

Issue: 1

Pages: 183-188

Type: Article

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Data source: Scopus