Nanoscopic study of ZnO films by electron beam induced current in the scanning tunneling microscope

  1. Urbieta, A.
  2. Fernández, P.
  3. Piqueras, J.
  4. Vasco, E.
  5. Zaldo, C.
Revue:
Journal of Optoelectronics and Advanced Materials

ISSN: 1454-4164

Année de publication: 2004

Volumen: 6

Número: 1

Pages: 183-188

Type: Article