Influence of the calibration kit on the estimation of parasitic effects in HEMT devices at microwave frequencies

  1. Miranda, J.M.
  2. Fager, C.
  3. Zirath, H.
  4. Sakalas, P.
  5. Muñoz, S.
  6. Sebastián, J.L.
Aldizkaria:
IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Argitalpen urtea: 2002

Alea: 51

Zenbakia: 4

Orrialdeak: 650-655

Mota: Artikulua

DOI: 10.1109/TIM.2002.803077 GOOGLE SCHOLAR
Datuen iturria: Scopus