Influence of the calibration kit on the estimation of parasitic effects in HEMT devices at microwave frequencies

  1. Miranda, J.M.
  2. Fager, C.
  3. Zirath, H.
  4. Sakalas, P.
  5. Muñoz, S.
  6. Sebastián, J.L.
Revue:
IEEE Transactions on Instrumentation and Measurement

ISSN: 0018-9456

Année de publication: 2002

Volumen: 51

Número: 4

Pages: 650-655

Type: Article

DOI: 10.1109/TIM.2002.803077 GOOGLE SCHOLAR
La source de données: Scopus