X-ray fluorescence analysis by the fundamental parameters method without explicit knowledge of the excitation beam spectrum

  1. Delgado Martínez, V.
  2. Martínez Hidalgo, C.
  3. Barrea, R.A.
Journal:
X-Ray Spectrometry

ISSN: 0049-8246

Year of publication: 2000

Volume: 29

Issue: 3

Pages: 245-248

Type: Article

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Data source: Scopus