Electron-beam-induced current study of electrically active defects in 4H-SiC

  1. Díaz-Guerra, C.
  2. Piqueras, J.
Aldizkaria:
Journal of Physics Condensed Matter

ISSN: 0953-8984

Argitalpen urtea: 2004

Alea: 16

Zenbakia: 2

Mota: Biltzar ekarpena

DOI: 10.1088/0953-8984/16/2/026 GOOGLE SCHOLAR