Atomic scale mapping of phase segregation at CMR grain boundaries in the scanning transmission electron microscope

  1. Varela, M.
  2. Peña, V.
  3. Sefrioui, Z.
  4. Lupini, A.R.
  5. Santamaria, J.
  6. Pennycook, S.J.
Journal:
Microscopy and Microanalysis

ISSN: 1431-9276

Year of publication: 2004

Volume: 10

Issue: SUPPL. 2

Pages: 330-331

Type: Conference paper

DOI: 10.1017/S1431927604884381 GOOGLE SCHOLAR
Data source: Scopus