Atomic scale mapping of phase segregation at CMR grain boundaries in the scanning transmission electron microscope

  1. Varela, M.
  2. Peña, V.
  3. Sefrioui, Z.
  4. Lupini, A.R.
  5. Santamaria, J.
  6. Pennycook, S.J.
Revue:
Microscopy and Microanalysis

ISSN: 1431-9276

Année de publication: 2004

Volumen: 10

Número: SUPPL. 2

Pages: 330-331

Type: Communication dans un congrès

DOI: 10.1017/S1431927604884381 GOOGLE SCHOLAR
La source de données: Scopus