Probing nanostructures site by site with the aberration-corrected STEM

  1. Pennycook, S.J.
  2. Lupini, A.R.
  3. Varela, M.
  4. Borisevich, A.
  5. Peng, Y.
  6. Buczko, R.
  7. Fan, X.
  8. McBride, J.R.
  9. Kippeny, T.C.
  10. Rosenthal, S.J.
  11. Franceschetti, A.
  12. Pantelides, S.T.
Journal:
Microscopy and Microanalysis

ISSN: 1431-9276

Year of publication: 2003

Volume: 9

Issue: SUPPL. 2

Pages: 2-3

Type: Conference paper