Probing nanostructures site by site with the aberration-corrected STEM

  1. Pennycook, S.J.
  2. Lupini, A.R.
  3. Varela, M.
  4. Borisevich, A.
  5. Peng, Y.
  6. Buczko, R.
  7. Fan, X.
  8. McBride, J.R.
  9. Kippeny, T.C.
  10. Rosenthal, S.J.
  11. Franceschetti, A.
  12. Pantelides, S.T.
Revue:
Microscopy and Microanalysis

ISSN: 1431-9276

Année de publication: 2003

Volumen: 9

Número: SUPPL. 2

Pages: 2-3

Type: Communication dans un congrès