Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis

  1. Balakrishnan, N.
  2. Castilla, E.
  3. Ling, M.H.
Journal:
Quality and Reliability Engineering International

ISSN: 1099-1638,  0748-8017

Year of publication: 2022

Volume: 38

Issue: 2

Pages: 989-1012

Type: Article

DOI: 10.1002/QRE.3031 GOOGLE SCHOLAR lock_openOpen access editor
Data source: Scopus