Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis

  1. Balakrishnan, N.
  2. Castilla, E.
  3. Ling, M.H.
Revue:
Quality and Reliability Engineering International

ISSN: 1099-1638 0748-8017

Année de publication: 2022

Volumen: 38

Número: 2

Pages: 989-1012

Type: Article

DOI: 10.1002/QRE.3031 GOOGLE SCHOLAR lock_openAccès ouvert editor