Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis

  1. Balakrishnan, N.
  2. Castilla, E.
  3. Ling, M.H.
Aldizkaria:
Quality and Reliability Engineering International

ISSN: 1099-1638,  0748-8017

Argitalpen urtea: 2022

Alea: 38

Zenbakia: 2

Orrialdeak: 989-1012

Mota: Artikulua

DOI: 10.1002/QRE.3031 GOOGLE SCHOLAR lock_openSarbide irekia editor
Datuen iturria: Scopus