EM-based likelihood inference for one-shot device test data under log-normal lifetimes and the optimal design of a CSALT plan

  1. Balakrishnan, N.
  2. Castilla, E.
Journal:
Quality and Reliability Engineering International

ISSN: 1099-1638,  0748-8017

Year of publication: 2022

Volume: 38

Issue: 2

Pages: 780-799

Type: Article

DOI: 10.1002/QRE.3014 GOOGLE SCHOLAR
Data source: Scopus