EM-based likelihood inference for one-shot device test data under log-normal lifetimes and the optimal design of a CSALT plan

  1. Balakrishnan, N.
  2. Castilla, E.
Aldizkaria:
Quality and Reliability Engineering International

ISSN: 1099-1638,  0748-8017

Argitalpen urtea: 2022

Alea: 38

Zenbakia: 2

Orrialdeak: 780-799

Mota: Artikulua

DOI: 10.1002/QRE.3014 GOOGLE SCHOLAR
Datuen iturria: Scopus